XO/VCXO/TCXO Full-Temperature Test System

Key Features

• Simultaneous frequency acquisition      
• Zero-dead-time readings
• Independent counter per channel
• Backplane Architecture
• 16 - 64 DUTs per card 
• DIN connectors for robust swapping
• Enables wider testing capability:
•  Frequency vs. Temperature 
  • ADEV
  • Trim Effect
  • Warm-up
  • Microjumps
  • Thermal Hysteresis

Applications

• Enables temperature qualification of systems based on precision timing including: GPS, Radar, Radios, Guided Munitions, SATCOM, Cellular Infrastructure, Stratum-Compliant Devices, SARSAT, Test Instrumentation, Quantum Computing, A.I. Data Centers, and more.
• Ideal for TCXO manufacturers to test the majority of frequency-based parameters such as frequency vs. temperature, ADEV, and warm-up at production volumes.