FAS300-H Burn-in Aging System for XO/VCXO/TCXO
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OCXO Aging and Room-Temperature ADEV System
Key Features
- Simultaneous frequency acquisition
- Zero-dead-time readings
- Independent counter per channel
- Gate times of 10ms to 24 hours
- High channel-to-channel isolation
- Backplane Architecture
- 16 - 64 DUTs per card
- DIN connectors for robust swapping
Applications
- Enables room-temperature qualification of systems based on precision timing including: GPS, Radar, Radios, Guided Munitions, SATCOM, Cellular Infrastructure, Stratum-Compliant Devices, SARSAT, Test Instrumentation, Quantum Computing, A.I. Data Centers, and more.
- Ideal for OCXO manufacturers to test frequency-based parameters such as ADEV and warm-up at production volumes.
